High-fidelity transport of trapped-ion qubits through an X-junction trap array.

Abstract

We report reliable transport of (9)Be(+) ions through an "X junction" in a 2D trap array that includes a separate loading and reservoir zone. During transport the ion's kinetic energy in its local well increases by only a few motional quanta and internal-state coherences are preserved. We also examine two sources of energy gain during transport: a… (More)

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Cite this paper

@article{Blakestad2009HighfidelityTO, title={High-fidelity transport of trapped-ion qubits through an X-junction trap array.}, author={R. Brad Blakestad and Christian Ospelkaus and A P Vandevender and James Amini and Joshua Britton and Dietrich Leibfried and D. J. Wineland}, journal={Physical review letters}, year={2009}, volume={102 15}, pages={153002} }