High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images

In this paper, the paper discuss a diagnostics methodology based on the combined use of advanced chip cooling technology and high-resolution time-integrated images of the light emission due to off-state leakage current (LEOSLC). The methodology was successfully applied to the debug of an IBM microprocessor chip fabricated in the 90 nm SOI technology… CONTINUE READING