Hierarchical test generation and design for testability methods for ASPPs and ASIPs

@article{Ghosh1999HierarchicalTG,
  title={Hierarchical test generation and design for testability methods for ASPPs and ASIPs},
  author={Indradeep Ghosh and Anand Raghunathan and Niraj K. Jha},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
  year={1999},
  volume={18},
  pages={357-370}
}
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