Hierarchical Scan and Atpg for Two Stage Wrapper

  • Published 2016

Abstract

There are multiple scenarios where at-speed coverage over core boundaries is difficult. The idea is to resolve this problem using two stage wrapper. Generally single stage wrapper is used in the present design techniques, and is used in industries. Here two stage wrapper is used in which test coverage has been increased. Additional scan compression architecture is introduced to reduce the pattern count and test time.

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Cite this paper

@inproceedings{2016HierarchicalSA, title={Hierarchical Scan and Atpg for Two Stage Wrapper}, author={}, year={2016} }