Hierarchical Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips

@inproceedings{Goel2002HierarchicalDI,
  title={Hierarchical Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips},
  author={Sandeep Kumar Goel and Bart Vermeulen},
  booktitle={ITC},
  year={2002}
}
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