# Height distribution of equipotential lines in a region confined by a rough conducting boundary

@article{deCastro2014HeightDO, title={Height distribution of equipotential lines in a region confined by a rough conducting boundary}, author={Caio P. de Castro and Thiago A. de Assis and Caio M. C. de Castilho and Roberto Fernandes Silva Andrade}, journal={Journal of Physics: Condensed Matter}, year={2014}, volume={26} }

This work considers the behavior of the height distributions of the equipotential lines in a region confined by two interfaces: a cathode with an irregular interface and a distant flat anode. Both boundaries, which are maintained at distinct and constant potential values, are assumed to be conductors. The morphology of the cathode interface results from the deposit of 2 × 104 monolayers that are produced using a single competitive growth model based on the rules of the Restricted Solid on Solid…

## 4 Citations

### A ug 2 01 4 Height distribution of equipotential lines in a region confined by a rough conducting boundary

- Physics
- 2022

This work considers the behavior of the height distributions of the equipotential lines in a region confined by two interfaces: a cathode with an irregular interface and a distant flat anode. Both…

### The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots

- PhysicsScientific reports
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It is shown that the exponent must be considered when calculating the slope characterization parameter (SCP) and thus provides a relevant method of more precisely extracting the characteristic field enhancement factor from the slope of the FN plot.

### The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots

- Physics
- 2015

The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots

### Hallmarks of the Kardar–Parisi–Zhang universality class elicited by scanning probe microscopy

- Materials Science
- 2016

Scanning probe microscopy is a fundamental technique for the analysis of surfaces. In the present work, the interface statistics of surfaces scanned with a probe tip is analyzed for both in silico…

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