Height distribution of equipotential lines in a region confined by a rough conducting boundary
@article{deCastro2014HeightDO, title={Height distribution of equipotential lines in a region confined by a rough conducting boundary}, author={Caio P. de Castro and Thiago A. de Assis and Caio M. C. de Castilho and Roberto Fernandes Silva Andrade}, journal={Journal of Physics: Condensed Matter}, year={2014}, volume={26} }
This work considers the behavior of the height distributions of the equipotential lines in a region confined by two interfaces: a cathode with an irregular interface and a distant flat anode. Both boundaries, which are maintained at distinct and constant potential values, are assumed to be conductors. The morphology of the cathode interface results from the deposit of 2 × 104 monolayers that are produced using a single competitive growth model based on the rules of the Restricted Solid on Solid…
4 Citations
A ug 2 01 4 Height distribution of equipotential lines in a region confined by a rough conducting boundary
- Physics
- 2022
This work considers the behavior of the height distributions of the equipotential lines in a region confined by two interfaces: a cathode with an irregular interface and a distant flat anode. Both…
The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots
- PhysicsScientific reports
- 2015
It is shown that the exponent must be considered when calculating the slope characterization parameter (SCP) and thus provides a relevant method of more precisely extracting the characteristic field enhancement factor from the slope of the FN plot.
The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots
- Physics
- 2015
The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots
Hallmarks of the Kardar–Parisi–Zhang universality class elicited by scanning probe microscopy
- Materials Science
- 2016
Scanning probe microscopy is a fundamental technique for the analysis of surfaces. In the present work, the interface statistics of surfaces scanned with a probe tip is analyzed for both in silico…
References
SHOWING 1-10 OF 30 REFERENCES
Field and electric potential of conductors with fractal geometry
- Physics
- 2007
In this study, the behavior of the electric field and its potential are investigated in a region bounded by a rough fractal surface and a distant plane. Both boundaries, maintained at distinct…
On Fractal Properties of Equipotentials over a Real Rough Surface Faced to Plasma in Fusion Devices
- Physics
- 2008
We consider a sheath region bounded by a corrugated surface of material conductor and a flat boundary held to a constant voltage bias. The real profile of the film deposited from plasma on a limiter…
Fractal properties of equipotentials close to a rough conducting surface
- Physics
- 1999
The Koch curve is used in the problem of evaluating and characterizing the electric equipotential lines in the infinite semi-space limited by a rough conducting one-dimensional surface. The solution…
Distribution of scaled height in one-dimensional competitive growth profiles.
- PhysicsPhysical review. E, Statistical, nonlinear, and soft matter physics
- 2012
This work investigates the scaled height distribution, ρ(q), of irregular profiles that are grown based on two sets of local rules: those of the restricted solid on solid (RSOS) and ballistic deposition (BD) models, and identifies this phenomenon as a transition from Kardar-Parisi-Zhang behavior to Edwards-Wilkinson behavior back to KPZ behavior.
Effect of the local morphology in the field emission properties of conducting polymer surfaces
- PhysicsJournal of physics. Condensed matter : an Institute of Physics journal
- 2013
The results show that local roughness reveals the presence of specific sharp emitting spots with a smooth geometry, which are the main ones responsible for the emission efficiency of such surfaces for larger deposition times.
Universal and nonuniversal features in the crossover from linear to nonlinear interface growth.
- PhysicsPhysical review. E, Statistical, nonlinear, and soft matter physics
- 2006
A restricted solid-on-solid model involving deposition and evaporation with probabilities p and 1 - p, respectively, in one-dimensional substrates presents a crossover from Edwards-Wilkinson to Kardar-Parisi-Zhang scaling for p approximately 0.5, in excellent agreement with the theoretically predicted universal value phi=4 and improves previous numerical estimates.
Growth model with restricted surface relaxation.
- MathematicsPhysical review. E, Statistical, nonlinear, and soft matter physics
- 2002
Signs are found of a similar crossover, that is, logarithmic temporal behavior of roughness in short times and power law behavior in asymptotic times in a growth model with restricted surface relaxation process.
Analysis of radio-frequency absorption and electric and magnetic field enhancements due to surface roughness
- Physics
- 2009
The radio-frequency (rf) power absorption due to a small hemispherical protrusion on a resonant cavity’s surface is computed analytically. This protrusion may assume arbitrary values of permittivity,…
Scale invariance of a diodelike tunnel junction
- Physics
- 2013
We measure the current vs voltage (I-V) characteristics of a diodelike tunnel junction consisting of a sharp metallic tip placed at a variable distance d from a planar collector and emitting…