Healing of DSP Circuits Under Power Bound Using Post-Silicon Operand Bitwidth Truncation

@article{Narasimhan2012HealingOD,
  title={Healing of DSP Circuits Under Power Bound Using Post-Silicon Operand Bitwidth Truncation},
  author={Seetharam Narasimhan and Keerthi Kunaparaju and Swarup Bhunia},
  journal={IEEE Transactions on Circuits and Systems I: Regular Papers},
  year={2012},
  volume={59},
  pages={1932-1941}
}
Increasing device parameter variations in nanometer CMOS technologies cause large spread in circuit parameters such as delay and power, leading to parametric yield loss. For digital signal processing (DSP) hardware, variations in circuit parameters can significantly affect the quality of service (QoS). Existing post-silicon calibration and repair approaches rely on adaptation of circuit operating parameters such as voltage, frequency, or body bias and typically incur large delay or power… CONTINUE READING

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