Harmony: static noise analysis of deep submicron digital integrated circuits

  title={Harmony: static noise analysis of deep submicron digital integrated circuits},
  author={Kenneth L. Shepard and Vinod Narayanan and Ron Rose},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of very large scale integrated (VLSI) systems. A metric for noise immunity is defined, and a static noise analysis methodology based on this noise-stability metric is introduced to demonstrate how noise can be analyzed systematically on a full-chip basis using simulationbased transistor-level analysis. We then describe Harmony… CONTINUE READING
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