Harmony: static noise analysis of deep submicron digital integrated circuits

@article{Shepard1999HarmonySN,
  title={Harmony: static noise analysis of deep submicron digital integrated circuits},
  author={Kenneth L. Shepard and Vinod Narayanan and Ron Rose},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
  year={1999},
  volume={18},
  pages={1132-1150}
}
As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of very large scale integrated (VLSI) systems. A metric for noise immunity is defined, and a static noise analysis methodology based on this noise-stability metric is introduced to demonstrate how noise can be analyzed systematically on a full-chip basis using simulationbased transistor-level analysis. We then describe Harmony… CONTINUE READING
Highly Cited
This paper has 106 citations. REVIEW CITATIONS

26 Figures & Tables

Topics

Statistics

051015'00'02'04'06'08'10'12'14'16'18
Citations per Year

107 Citations

Semantic Scholar estimates that this publication has 107 citations based on the available data.

See our FAQ for additional information.