Hardness assurance for space system microelectronics

@inproceedings{Pease1994HardnessAF,
  title={Hardness assurance for space system microelectronics},
  author={Ronald L. Pease and David R. Alexander},
  year={1994}
}
Abstract The objective of this paper is to review hardness assurane procedures which are appropriate for modern microcircuits in space applications and to identify issues which may influence the selection of one procedure over another. 

Citations

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SHOWING 1-10 OF 11 CITATIONS

Comparison of radiation analyses

  • 2013 6th International Conference on Recent Advances in Space Technologies (RAST)
  • 2013
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CITES BACKGROUND
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Radiation Hardness Assurance for Space Systems

Christian Poivey, John H. Day
  • 2013

Parametric and Threshold Studies of Single Event Sensitivity

  • IEEE Transactions on Nuclear Science
  • 2007
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CITES BACKGROUND

Radiation assurance for the space environment

  • 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
  • 2004

Radiation effects in the space telecommunications environment

  • 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)
  • 2000