• Corpus ID: 133719866

Handbook of X-Ray Photoelectron Spectroscopy

  title={Handbook of X-Ray Photoelectron Spectroscopy},
  author={John F. Moulder and William F. Stickle and Warren M. Sobol and Kenneth D. Bomben},
X-ray photoelectron spectroscopy (XPS) is a dedicated surface The surface of steel disc was examined by means of XPS technique, and its chemical Moulder J.F., Stickle W.F., Sobol P.E., Bomben K.D.: Handbook of X-ray. X-ray photoelectron spectroscopy of films that were exposed to air revealed surface oxidation, with titanium Figure 2 shows the XPS titanium 2p ionization region of an 82 nm thick film. Handbook of Chemistry and Physics, 92nd Ed., CRC. The valences of Ni and Ti ions were determined… 

Thermal Analysis of Photoelectron Emission (PE) and X-ray Photoelectron Spectroscopy (XPS) Data for Iron Surfaces Scratched in Air, Water, and Liquid Organics

Little is known about the temperature dependence of electron transfer occurring at real metal surfaces. For iron surfaces scratched in seven environments, we report Arrhenius activation energies

X-Ray Photoelectron Spectroscopy ( XPS ) : An Introduction

This paper serves as a primer towards X-ray photoelectron spectroscopy (XPS) and an introduction towards the information it can provide in respect of heterogeneous and nanoscale catalysis.

X-Ray Photoelectron Spectroscopy Study of Pt-Oxide Thin Films Deposited by Reactive Sputtering Using O2/Ar Gas Mixtures

Thin-film oxides of Pt were grown reactively by rf magnetron sputtering and characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).

The complementary nature of x-ray photoelectron spectroscopy and angle-resolved x-ray diffraction Part I: Background and theory

X-ray photoelectron spectroscopy (XPS) and x-ray diffraction (XRD) are often used to analyze the surface of complex oxide materials. When XRD is used in an atypical angle resolved x-ray diffraction

X-ray photoelectron spectroscopy study of thin TiO2 films cosputtered with Al.

The enhancement of HBO and higher BE shifts of the O 1s spectra as a function of cosputtered Al in the film imply the formation of an Al-O-Ti linkage.

X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES)

X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), and Auger electron spectroscopy (AES) are widely used materials characterization techniques

The complementary nature of x-ray photoelectron spectroscopy and angle-resolved x-ray diffraction part II: Analysis of oxides on dental alloys

X-ray photoelectron spectroscopy (XPS) and angle-resolved x-ray diffraction (ARXRD) were used to analyze the oxide layer on three palladium-gallium-based dental casting alloys. The oxide layers were