Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices

@article{Puglisi2016GuidelinesFA,
  title={Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices},
  author={Francesco Maria Puglisi and Paolo Pavan},
  journal={IEEE Transactions on Instrumentation and Measurement},
  year={2016},
  volume={65},
  pages={1435-1442}
}
In this paper, we propose new guidelines for the analysis of random telegraph noise (RTN) in electronic devices. Starting from an in-depth understanding of RTN signal characteristics, we will identify the correct measurement conditions to enable RTN analysis as a characterization tool for electronic devices. The estimate of RTN statistical parameters may… CONTINUE READING