Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates

@article{Ivanov2004GuestEI,
  title={Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates},
  author={Andr{\'e} Ivanov and Fabrizio Lombardi and Cecilia Metra},
  journal={IEEE Des. Test Comput.},
  year={2004},
  volume={21},
  pages={274-276}
}
274 0740-7475/04/$20.00 © 2004 IEEE Copublished by the IEEE CS and the IEEE CASS IEEE Design & Test of Computers IT IS WITH GREAT PLEASURE that we introduce the special issue on Testing at MultiGbps Rates to the IEEE Design & Test readership. Manufacturing today’s high-performance digital systems requires VLSI testing at speeds of multigigabits per second (multiGbps). For this special issue, we’ve selected four articles to cover a wide spectrum of techniques and applications critical to testing…