Growth and characterization of YBa2Cu3O7−δ thin films with specifically reduced critical temperature

@inproceedings{Behner1993GrowthAC,
  title={Growth and characterization of YBa2Cu3O7−δ thin films with specifically reduced critical temperature},
  author={H. Behner and K. R{\"u}hrnschopf and G. Wedler and William Rauch},
  year={1993}
}
Abstract For the purpose of fabricating all-YBCO S-N-S Josephson junctions, thin films oy YBa 2 Cu 3 O 7−δ (YBCO) with reduced critical temperature (YBCO∗) were prepared by means of DC-magnetron sputtering. The YBCO∗ films showed a critical temperature around 70 K which could not be increased by an oxygen or oxygen plasma treatment. The samples were characterized by resistivity measurements, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and low-energy electron diffraction… CONTINUE READING