Graphene at high bias:

Abstract

Graphene and few-layer graphene at high bias expose a wealth of phenomena due to the high temperatures reached. With in-situ transmission electron microscopy (TEM) we observe directly how the current modifies the structure, and vice versa. In some samples, cracks propagate from the edges of the flakes, leading to the formation of narrow constrictions or to… (More)

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Cite this paper

@inproceedings{Barreiro2012GrapheneAH, title={Graphene at high bias:}, author={A. Barreiro and Mark Hermann R{\"u}mmeli}, year={2012} }