Graphene as transparent electrode for direct observation of hole photoemission from silicon to oxide

Abstract

photoemission from silicon to oxide Rusen Yan (闫汝森), Qin Zhang, Oleg A. Kirillov, Wei Li, James Basham, Alex Boosalis, Xuelei Liang, Debdeep Jena, Curt A. Richter, Alan C. Seabaugh, David J. Gundlach, Huili G. Xing, and N. V. Nguyen Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899… (More)

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