Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data.

@article{Cremona2000GrainSD,
  title={Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X-ray diffraction data.},
  author={Cremona and Maur{\'i}cio and LC ScavardaDoCarmo and Prioli and D Nunes and Zanette and Caride and Albuquerque},
  journal={Journal of microscopy},
  year={2000},
  volume={197 3},
  pages={260-267}
}
The influence of the deposition temperature on the grain size of polycrystalline lithium fluoride (LiF) thin films is studied using a mathematical morphology method. On atomic force microscopy images of the LiF surface, the grain sizes and shapes are determined by applying the watershed technique, together with a shape factor algorithm. Also, the domain size of the film structure, determined by an X-ray diffraction data analysis, is compared and correlated with the mean grain size as a function… CONTINUE READING