Goodness-of-fit tests for GEE with correlated binary data

@inproceedings{Pan2002GoodnessoffitTF,
  title={Goodness-of-fit tests for GEE with correlated binary data},
  author={Wei Pan},
  year={2002}
}
The marginal logistic regression, in combination with GEE, is an increasingly important method in dealing with correlated binary data. As for independent binary data, when the number of possible combinations of the covariate values in a logistic regression model is much larger than the sample size, such as when the logistic model contains at least one continuous covariate, many existing chi-square goodness-of-fit tests either are not applicable or have some serious drawbacks. In this paper two… CONTINUE READING

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