Glossary of Crystal Terminology

  • Published 2010

Abstract

Allan Variance: Also known as short‐term stability, this is the measure of oscillator stability in the time domain. Commonly referred to as the Allan variance, it measures the RMS change in successive frequency measurements for short gate times (milliseconds to seconds) and is important in timing applications. It typically improves as the gate time increases until it becomes a measure of the medium to long term drift of the oscillator. This drift is either the result of the temperature coefficient of the oscillator, and/or the aging.

Cite this paper

@inproceedings{2010GlossaryOC, title={Glossary of Crystal Terminology}, author={}, year={2010} }