GlYFF: A framework for global yield and floorplan aware design optimization

Diminishing yields for modern CMOS and emerging technologies have become a major growing concern for IC manufacturers due to its direct impact on revenue. To this end, “Design for Yield (DFY)” have been proposed to proactively address manufacturing yield issues in the system design stage. While many DFY approaches have been developed for caches, GPUs and… CONTINUE READING