Gentest: an automatic test-generation system for sequential circuits

@article{Cheng1989GentestAA,
  title={Gentest: an automatic test-generation system for sequential circuits},
  author={Wu-Tung Cheng and Tapan J. Chakraborty},
  journal={Computer},
  year={1989},
  volume={22},
  pages={43-49}
}
A description is given of Gentest, with emphasis on STG2, a sequential test generator that uses the Back test-generation algorithm and the Split value model. The performance of STG2 on a Convex C-1 computer is compared with that of its predecessor, STG1 and STG1.5. Results are also presented for another set of experiments for Gentest on a Sun 3/60 workstation.<<ETX>> 
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