Generation of deterministic test patterns by minimal basic test sets

@inproceedings{Kunzmann1992GenerationOD,
  title={Generation of deterministic test patterns by minimal basic test sets},
  author={Arno Kunzmann},
  booktitle={EURO-DAC},
  year={1992}
}
The minimization of test sets for combinational circuits is known to be an important, but unfortunately NP-hard problem. The test size influences for instance the test application time and the storage requirements. This is of special interest if deterministic test pattern sets have to be used for a self test or generated by a special purpose test chip. In this paper it will be shown how the storage requirements can be drastically reduced (in average over 80%) by selecting only a small subset of… CONTINUE READING

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