Generation of Mixed Test Sets for Transition Faults

  • Irith Pomeranz
  • Published 2012 in
    IEEE Transactions on Very Large Scale Integration…

Abstract

Test sets that contain both broadside and skewed-load tests are important for achieving the highest possible delay fault coverage for standard-scan circuits. Both types of tests can be represented as 〈s<sub>1</sub>, v<sub>1</sub>, s<sub>2</sub>, v<sub>2</sub> 〉, where s<sub>1</sub> and s<sub>2</sub> are states, and v<sub>1</sub> and v<sub>2</sub> are… (More)
DOI: 10.1109/TVLSI.2011.2161786

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