Generating Succinct Test Cases Using Don't Care Analysis

@article{Nguyen2015GeneratingST,
  title={Generating Succinct Test Cases Using Don't Care Analysis},
  author={Cuong Quoc Nguyen and Hiroaki Yoshida and Mukul R. Prasad and Indradeep Ghosh and Koushik Sen},
  journal={2015 IEEE 8th International Conference on Software Testing, Verification and Validation (ICST)},
  year={2015},
  pages={1-10}
}
We study the problem of reducing test cases generated by bit vector based symbolic execution test generators. In particular, we first consider a guileless test case generation approach that generates assignment statements for each symbolic scalars, array and structure elements and object fields. We show that test cases generated by this approach can be significantly verbose. We then propose a method for making the generated test cases more succinct using a novel analysis entitled don't care… CONTINUE READING
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