Generalized spectral method for near-field optical microscopy

  title={Generalized spectral method for near-field optical microscopy},
  author={B. Y. Jiang and L. M. Zhang and Antonio Castro Neto and Dimitri Basov and Michael M. Fogler},
  journal={Journal of Applied Physics},
Electromagnetic interaction between a sub-wavelength particle (the “probe”) and a material surface (the “sample”) is studied theoretically. The interaction is shown to be governed by a series of resonances corresponding to surface polariton modes localized near the probe. The resonance parameters depend on the dielectric function and geometry of the probe as well as on the surface reflectivity of the material. Calculation of such resonances is carried out for several types of axisymmetric… 
Optical constants from scattering-type scanning near-field optical microscope
Scattering-type scanning near-field optical microscopy (s-SNOM) allows for the characterization of optical properties of samples at the nanoscale, well below the diffraction limit of the
Rigorous numerical modeling of scattering-type scanning near-field optical microscopy and spectroscopy
Over the last decade, scattering-type scanning near-field optical microscopy and spectroscopy have been widely used in nano-photonics and material research due to their fine spatial resolution and
Scattering of electromagnetic waves from a cone with conformal mapping: Application to scanning near-field optical microscope
We study the response of a conical metallic surface to an external electromagnetic (em) field by representing the fields in basis functions containing the integrable singularity at the tip of the
Quantifying Nanoscale Electromagnetic Fields in Near-Field Microscopy by Fourier Demodulation Analysis
Confining light to sharp metal tips has become a versatile technique to study optical and electronic properties far below the diffraction limit. Particularly near-field microscopy in the mid-infrared
Effect of sample anisotropy on scanning near-field optical microscope images
Scattering-type scanning near-field optical microscopy (s-SNOM) has been widely used to characterize strongly correlated electronic, two dimensional, and plasmonic materials, and it has enormous
Probing subwavelength in-plane anisotropy with antenna-assisted infrared nano-spectroscopy
An easy-to-implement method to probe the in-plane dielectric responses of materials with the assistance of a metallic disk micro-antenna is reported and can be elegantly adapted to retrieve theIn-plane anisotropic response of a broad range of materials, i.e. subwavelength microcrystals, van-der-Waals materials, or topological insulators.
Imaging of Anomalous Internal Reflections of Hyperbolic Phonon-Polaritons in Hexagonal Boron Nitride.
Scanning near-field optical microscopy is used to study the response of hexagonal boron nitride nanocones at infrared frequencies, where this material behaves as a hyperbolic medium and reports on shape-dependent resonances that attest to low dielectric losses that permit coherent standing waves of the subdiffractional polaritons to form.
Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research
This work focuses on the pioneering efforts to study the nanoscale electrodynamic properties of plasmonic metamaterials, strongly correlated quantum materials, and polaritonic systems at room or cryogenic temperatures.
High-efficiency scattering probe design for s-polarized near-field microscopy
In a conventional scattering-type scanning near-field optical microscopy setup, the atomic force microscope probe is unable to effectively couple with s-polarized light, resulting in low signal and
Dipole modelling for a robust description of subdiffractional polariton waves.
It is demonstrated that the HDA modelling self-consistently explains the measured complex-valued polariton near-field, while being a general approach applicable to other polariton types, like plasmon- and exciton-polaritons, active in the wide range of vdW materials.


Quasi-analytical model for scattering infrared near-field microscopy on layered systems.
A quantitative quasi-analytical model is used to predict and analyze signals on layered samples measured by infrared scattering-type scanning near-field optical microscopy and opens the possibility to extract the local layer thickness of thin films or the dielectric functions that allow one to draw conclusions on the material composition, conductivity or crystal structure on the nanoscale.
Probing polarization and dielectric function of molecules with higher order harmonics in scattering-near-field scanning optical microscopy
The idealized system of an atomically flat metallic surface [highly oriented pyrolytic graphite (HOPG)] and an organic monolayer (porphyrin) was used to determine whether the dielectric function and
Nano-optical imaging and spectroscopy of order, phases, and domains in complex solids
The structure of our material world is characterized by a large hierarchy of length scales that determines material properties and functions. Increasing spatial resolution in optical imaging and
Model for quantitative tip-enhanced spectroscopy and the extraction of nanoscale-resolved optical constants
Near-field infrared spectroscopy by elastic scattering of light from a probe tip resolves optical contrasts in materials at dramatically subwavelength scales across a broad energy range, with the
Substrate-enhanced infrared near-field spectroscopy.
A dramatic enhancement of the signal amplitude and spectroscopic contrast of the sample layer, together with a change of the spectral line shape is obtained, opening the possibility to perform ultra-sensitive near field infrared spectroscopy of monolayers and biomolecules.
Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy.
A novel analytical model is presented that quantitatively reproduces approach curves on a Au surface and yields an unprecedented agreement with amplitude and phase spectra recorded on a phonon-polariton resonant SiC sample.
Curvature effects in surface plasmon dispersion and coupling
We have studied the resonant coupling of surface plasmons in curved thin-film tunneling geometries by obtaining the dispersion relations for the system. The surface plasmon dispersion relations are
Near-field microscopy by elastic light scattering from a tip
  • F. Keilmann, R. Hillenbrand
  • Physics
    Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences
  • 2004
Ultraresolution microscopy far beyond the classical Abbe diffraction limit of one half wavelength (λ/2), and also beyond the practical limit (ca. λ/10) of aperture–based scanning near–field optical microscopy (SNOM), and theoretical modelling that explains and predicts s–SNOM contrast on the basis of the local dielectric function is described.
Full simulations of the apertureless scanning near field optical microscopy signal: achievable resolution and contrast.
The solution of the three-dimensional Maxwell equations does not involve approximations and the solution includes large tips and substrates, strong interaction, interferometric detection and demodulation at higher harmonics, a significant step towards quantitative simulations.
Sub-diffractional volume-confined polaritons in the natural hyperbolic material hexagonal boron nitride.
Three-dimensionally confined 'hyperbolic polaritons' in boron nitride nanocones that support four series (up to the seventh order) modes in two spectral bands are reported on.