Generalization in Metric Learning: Should the Embedding Layer Be Embedding Layer?
@article{Vo2018GeneralizationIM, title={Generalization in Metric Learning: Should the Embedding Layer Be Embedding Layer?}, author={Nam S. Vo and James Hays}, journal={2019 IEEE Winter Conference on Applications of Computer Vision (WACV)}, year={2018}, pages={589-598} }
This work studies deep metric learning under small to medium scale as we believe that better generalization could be a contributing factor to the improvement of previous fine-grained image retrieval methods; it should be considered when designing future techniques. In particular, we investigate using other layers in a deep metric learning system (besides the embedding layer) for feature extraction and analyze how well they perform on training data and generalize to testing data. From this study…
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