General expression for the reflectance of an all-dielectric multilayer stack.


A converted characteristic matrix method has been used to derive a generalized expression for reflectance R (for wavelength lambda at normal incidence) of an all-dielectric multilayer stack consisting of K layers of refractive indices n(1),n(2),n(3)... n(k-1),n(k) having quarterwave thicknesses at the monitoring wavelength lambda(0). The expression thus… (More)
DOI: 10.1364/AO.27.004110


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