Gate exhaustive testing

@article{Cho2005GateET,
  title={Gate exhaustive testing},
  author={Kyoung Youn Cho and Subhasish Mitra and Edward J. McCluskey},
  journal={IEEE International Conference on Test, 2005.},
  year={2005},
  pages={7 pp.-777}
}
A gate exhaustive test set applies all possible input combinations to each gate in a combinational circuit, and observes the gate response at an observation point such as a primary output or a scan cell. In this paper, we analyze the effectiveness of the gate exhaustive test metric in detecting defective chips, and compare it with the single stuck-at fault, the N-detect, and the transition fault test metrics. Results from the Stanford CRC ELF35 and ELF18 test experiments show that gate… CONTINUE READING
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