Frensley, "GaAs Technology Perspective,
- R. W
- VLSZ Electronics,
The driver and sensor of the High Speed Test System (HSTS) must possess the following capabilities: be able to operate from DC to 100 MHz and above; be able to interface directly with ECL, TTL, and CMOS components; and be able to handle both the incircuit and device testing environments. A hybrid GaAs device has been designed and prototyped to meet these requirements. The circuits, the design issues, and the performance of this device are presented in this paper.