GaAs Driver and Sensor for a High-Speed Test System

Abstract

The driver and sensor of the High Speed Test System (HSTS) must possess the following capabilities: be able to operate from DC to 100 MHz and above; be able to interface directly with ECL, TTL, and CMOS components; and be able to handle both the incircuit and device testing environments. A hybrid GaAs device has been designed and prototyped to meet these requirements. The circuits, the design issues, and the performance of this device are presented in this paper.

DOI: 10.1109/TEST.1988.207775

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Cite this paper

@inproceedings{Tsai1988GaAsDA, title={GaAs Driver and Sensor for a High-Speed Test System}, author={Sheng-Jen Tsai and Charles D. Hechtman}, booktitle={ITC}, year={1988} }