GISAXS analysis of ion beam modified films and surfaces


Simple and efficient methods for the accurate structural characterization of ion-beam modified materials are important due to their interesting properties and many applications. Here we demonstrate the application of the Grazing incidence small angle X-ray scattering (GISAXS) method on the structural analysis of swift heavy ion-beam modified materials… (More)
DOI: 10.1016/j.cpc.2016.10.011


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@article{Buljan2017GISAXSAO, title={GISAXS analysis of ion beam modified films and surfaces}, author={Maja Buljan and Marko Karlusic and Nikolina Nekic and Marko Jercinovic and Iva Bogdanovic-Radovic and Sigrid Bernstorff and Nikola Radic and Igor Mekterovic}, journal={Computer Physics Communications}, year={2017}, volume={212}, pages={69-81} }