GEANT4 simulations in terms of radiation hardness of commercially available SRAM

Abstract

Commercial of the shelf (COTS) SRAMS were investigated by measurements and simulation in terms of radiation hardness. For the simulations the GEANT4 tool was used. With GEANT4 it is possible to determine the different particles generated by the applied energy as well as the radiation source. It was found that the single event upsets (SEU) is related to the radiation energy, technology node and react differently for the investigated SRAM. Furthermore a possible correlation between the generated particles and the SEU was found.

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Cite this paper

@article{Moujbani2015GEANT4SI, title={GEANT4 simulations in terms of radiation hardness of commercially available SRAM}, author={Aymen Moujbani and Kirsten Weide-Zaage and Berthold Romer and Frank Sabath}, journal={2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems}, year={2015}, pages={1-5} }