GABIST: A New Methodology to Find near Optimal LFSR for BIST Structure

  title={GABIST: A New Methodology to Find near Optimal LFSR for BIST Structure},
  author={Mehdi Kamal and Mehdi Salmani Jelodar and Shaahin Hessabi},
  journal={2007 14th IEEE International Conference on Electronics, Circuits and Systems},
Fault coverage and test time have important roles in using built in self-test (BIST). Two parameters are crucial and effective in BIST design: LFSR's polynomial (or configuration) and its initial seed. In this paper we propose a practical method for finding near optimal LFSR with genetic algorithm (GA) and show that LFSR is a good TPG compared with other TPGs. In this method, the candidate seeds are achieved through a deterministic approach, and an evolutionary approach is employed to obtain… CONTINUE READING


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Arithmetic Built-In Self-Test for Embedded Systems

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