Fundamental parameter determination to improve spectroscopical methods


In view of the lack of reference-materials and calibration samples, in particular at the nanoscale, reliable quantification schemes in x-ray fluorescence analysis and related methods call for higher accuracy of relevant x-ray fundamental parameters such as photoionisation cross sections, decay rates, line widths, and fluorescence yields, as well as Coster… (More)


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@article{Kolbe2016FundamentalPD, title={Fundamental parameter determination to improve spectroscopical methods}, author={Michael Kolbe and Philipp Honicke and M. Muller and Beatrix Pollakowski and Burkhard Beckhoff}, journal={2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)}, year={2016}, pages={1-2} }