Functional Test Selection for High Volume Manufacturing

  title={Functional Test Selection for High Volume Manufacturing},
  author={Vijay Gangaram and Deepa Bhan and James K. Caldwell},
  journal={Seventh International Workshop on Microprocessor Test and Verification (MTV'06)},
Validation and legacy test suites are often reused for achieving at speed coverage required for testing high frequency semiconductor chips. Porting validation tests to high volume manufacturing (HVM) flows involves extensive manual effort but is required to ensure high quality chips. Functional test selection is the problem of choosing a subset of tests… CONTINUE READING