Functional Scan Chain Testing

Abstract

Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (TPI) has been shown to be an effective technique to reduce the scan overhead. However once the scan chain is allowed to go through functional logic, the traditional alternating test… (More)

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Cite this paper

@inproceedings{Chang1998FunctionalSC, title={Functional Scan Chain Testing}, author={Douglas C Chang and Kwang-Ting Cheng and Malgorzata Marek-Sadowska and Mike Tien-Chien Lee}, booktitle={DATE}, year={1998} }