Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency.

Abstract

The charge-coupled devices used in electron microscopy are coated with a scintillating crystal that gives rise to a severe modulation transfer function (MTF). Exact knowledge of the MTF is imperative for a good correspondence between image simulation and experiment. We present a practical method to measure the MTF above the Nyquist frequency from the beam… (More)
DOI: 10.1017/S1431927611012633

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Cite this paper

@article{Broek2012FullyAM, title={Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency.}, author={Wouter Van den Broek and Sandra Van Aert and Dirk Van Dyck}, journal={Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada}, year={2012}, volume={18 2}, pages={336-42} }