Frugal linear network-based test decompression for drastic test cost reductions

@article{Rao2004FrugalLN,
  title={Frugal linear network-based test decompression for drastic test cost reductions},
  author={Wenjing Rao and Alex Orailoglu and G. Su},
  journal={IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004.},
  year={2004},
  pages={721-725}
}
In This work we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented by negligible hardware overhead, is constructed by mathematically analysing test data relationships, delivering in turn drastic test reductions. The proposed network drives a large number of internal scan chains with a short input vector, thus allowing significant reductions in both test time and test volume. The proposed… CONTINUE READING

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