From millibits to terabits per second and beyond - Over 60 years of innovation

@article{Jindal2009FromMT,
  title={From millibits to terabits per second and beyond - Over 60 years of innovation},
  author={Renuka Prasad Jindal},
  journal={2009 2nd International Workshop on Electron Devices and Semiconductor Technology},
  year={2009},
  pages={1-6}
}
  • R. Jindal
  • Published 1 June 2009
  • Engineering
  • 2009 2nd International Workshop on Electron Devices and Semiconductor Technology
Three innovations responsible for an explosive growth in available information bandwidth over the last 30 years are highlighted. These include the invention of the bipolar and MOS transistors, development of information theory and the invention of solid-state lasers. Although demonstrated 13 years later than the bipolar transistors, fundamental contributions that led to rapid adoption of MOS as the technology of choice in meeting the needs of wireless and lightwave communication systems is… 
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4 Citations
Background Citations
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4 Citations

Investigation of kink-induced excess RF channel noise in sub -50 nm PD-SOI MOSFETs
RF noise performance of PD-SOI MOSFETs at 40 nm gate length is reported. Using drift-diffusion transport, a good match between small signal measurements and simulations is obtained in presence of…
Physics of Noise Performance of Nanoscale Bulk MOS Transistors
Detailed physical understanding of the noise mechanisms that exist in bulk MOS transistors is developed. These sources of noise consist of the intrinsic fluctuations which are inherent in the device…
Foundations of Information Systems Dynamics
TLDR
Based on the mathematical foundations, eleven types of information measure efficacies and their distribution across information systems are put forward and comprehensively analyzed, which constitutes the basic theoretical framework of information systems dynamics with general significance.
Development of methodologies for characterization and modeling of devices for high frequency applications from small-signal S-parameters
TLDR
The development of this dissertation has contributed in improving the quality of de-embedding procedures, which directly affect the reliability of the measurement, characterization and modeling of BiCMOS devices.

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