Forward-looking fault simulation for improved static compaction

@article{Pomeranz2001ForwardlookingFS,
  title={Forward-looking fault simulation for improved static compaction},
  author={Irith Pomeranz and Sudhakar M. Reddy},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
  year={2001},
  volume={20},
  pages={1262-1265}
}
Fault simulation of a test set in an order different from the order of generation (e.g., reverse- or random-order fault simulation) is used as a fast and effective method to drop unnecessary tests from a test set in order to reduce its size. We propose an improvement to this type of fault simulation process that makes it even more effective in reducing the test-set size. The proposed improvement allows us to drop tests without simulating them based on the fact that the faults they detect will… CONTINUE READING

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