Formal verification of analog circuits in the presence of noise and process variation

@article{Narayanan2010FormalVO,
  title={Formal verification of analog circuits in the presence of noise and process variation},
  author={Rajeev Narayanan and Behzad Akbarpour and Mohamed H. Zaki and Sofi{\`e}ne Tahar and Lawrence C. Paulson},
  journal={2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)},
  year={2010},
  pages={1309-1312}
}
  • Rajeev Narayanan, Behzad Akbarpour, +2 authors Lawrence C. Paulson
  • Published in
    Design, Automation & Test in…
    2010
  • Computer Science
  • We model and verify analog designs in the presence of noise and process variation using an automated theorem prover, MetiTarski. Due to the statistical nature of noise, we propose to use stochastic differential equations (SDE) to model the designs. We find a closed form solution for the SDEs, then integrate the device variation due to the 0.18¿m fabrication process and verify properties using MetiTarski. We illustrate the proposed approach on an inverting Op-Amp Integrator and a Band-Gap… CONTINUE READING

    Create an AI-powered research feed to stay up to date with new papers like this posted to ArXiv

    Citations

    Publications citing this paper.
    SHOWING 1-10 OF 11 CITATIONS

    Formally Verifying Transfer Functions of Linear Analog Circuits

    VIEW 2 EXCERPTS
    CITES BACKGROUND & METHODS

    Statistical Run-Time Verification of Analog Circuits in Presence of Noise and Process Variation

    VIEW 1 EXCERPT
    CITES BACKGROUND

    Analog circuit verification by statistical model checking

    VIEW 1 EXCERPT
    CITES BACKGROUND

    References

    Publications referenced by this paper.
    SHOWING 1-2 OF 2 REFERENCES

    Analysis and Design of Analog Integrator Circuits

    • P. A. Gray, P. J. Hurst, S. H. Lewis, R. G. Meyer
    • Wiley
    • 2009
    VIEW 3 EXCERPTS
    HIGHLY INFLUENTIAL

    The influence and modeling of process variation and device mismatch for analog/rf circuit design

    • Yuhua Cheng
    • Engineering
    • Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)
    • 2002
    VIEW 3 EXCERPTS
    HIGHLY INFLUENTIAL