Focused ion beam (FIB) combined with high resolution scanning electron microscopy: a promising tool for 3D analysis of chromosome architecture.

@article{SchroederReiter2009FocusedIB,
  title={Focused ion beam (FIB) combined with high resolution scanning electron microscopy: a promising tool for 3D analysis of chromosome architecture.},
  author={Elizabeth Schroeder-Reiter and Fabi{\'a}n P{\'e}rez-Willard and Ulrike Zeile and Gerhard Wanner},
  journal={Journal of structural biology},
  year={2009},
  volume={165 2},
  pages={97-106}
}
Focused ion beam (FIB) milling in combination with field emission scanning electron microscopy (FESEM) was applied to investigations of metaphase barley chromosomes, providing new insight into the chromatin packaging in the chromosome interior and 3D distribution of histone variants in the centromeric region. Whole mount chromosomes were sectioned with FIB with thicknesses in the range of 7-20nm, resulting in up to 2000 sections, which allow high resolution three-dimensional reconstruction. For… CONTINUE READING