Focused Impedance Measurement (FIM): A New Technique with Improved Zone Localization

@article{Rabbani1999FocusedIM,
  title={Focused Impedance Measurement (FIM): A New Technique with Improved Zone Localization},
  author={K. Siddique-e Rabbani and Mohammed Mominul Hoque Sarker and Mohammad Abdur R. Akond and T. Akter},
  journal={Annals of the New York Academy of Sciences},
  year={1999},
  volume={873}
}
Abstract: Conventional four‐electrode impedance measurements (FEIM) cannot localize a zone of interest in a volume conductor. On the other hand, the recently developed electrical impedance tomography (EIT) system offers an image with reasonable resolution, but is complex and needs many electrodes. By placing two FEIM systems perpendicular to each other over a common zone at the center and combining the two results, it is possible to obtain enhanced sensitivity over this central zone. This is… 

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