Flux motion dynamics and self-organized criticality in YBCO thin films

Abstract

The analytical approximated result of the flux noise in mixed state under the current driving force is derived. The Anderson-Kim flux creep model is used to relate this noise to the current density. The numerical result is then compared with the flux noise data obtained from YBCO thin films measured with a DC SQUID. Using this method, we can estimate the… (More)

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Cite this paper

@article{Yu1995FluxMD, title={Flux motion dynamics and self-organized criticality in YBCO thin films}, author={L. K. Yu and W. J. Yeh and Y. H. Kao}, journal={IEEE Transactions on Applied Superconductivity}, year={1995}, volume={5}, pages={1725-1728} }