Flip-flop Selection to Maximize TDF Coverage with Partial Enhanced Scan

@article{Xu2007FlipflopST,
  title={Flip-flop Selection to Maximize TDF Coverage with Partial Enhanced Scan},
  author={Gefu Xu and A. Singh},
  journal={16th Asian Test Symposium (ATS 2007)},
  year={2007},
  pages={335-340}
}
Enhanced scan designs support high coverage TDF testing but with significant overhead. We present a flip-flop selection strategy for partial enhanced scan designs that offers a favorable trade-off between coverage and overhead. Experimental results using commercial ATPG tools show that 60-90% of the TDF coverage benefits of enhanced scan can be achieved at 10-30% of the cost. 
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