Fixed Hardware Implementation Using Built-in Generation of Functional Broadside Tests

  • SRIKANTH AKARAPU, D. V. RAJESHWARRAJU
  • Published 2014

Abstract

Considering full-scan circuits, incompletelyspecified tests, or test cubes, are used for test data compression. When considering path delay faults, certain specified input values in a test cube are needed only for determining the lengths of the paths associated with detected faults. Path delay faults, and therefore, small delay defects, would still be… (More)

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