Fine-Grained Redundancy in Adders

  title={Fine-Grained Redundancy in Adders},
  author={Patrick Ndai and Shih-Lien Lu and Dinesh Somasekhar and Kaushik Roy},
  journal={8th International Symposium on Quality Electronic Design (ISQED'07)},
We present a technique for fault tolerance in prefix-based adders, and show its application by implementing a Kogge-Stone adder. The technique is based on the fact that an n-bit Kogge-Stone adder can be split into two independent n-bit Han-Carlson (HC) adders by augmenting an additional computation stage to the adder. The presence of single faults only… CONTINUE READING