Finding Defective Elements in Planar Arrays Using Genetic Algorithms

  • J. A. Rodŕıguez
  • Published 2001

Abstract

A technique that allows to locate defective elements in planar arrays by using some samples of the degraded far-field power pattern is described. This approach uses genetic algorithms to minimize the square of the difference between the far-field power pattern obtained for a given configuration of failed elements and the measured one. The method also allows… (More)

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