Filter optimization for X-ray inspection of surface-mounted ICs

@inproceedings{Blish2002FilterOF,
  title={Filter optimization for X-ray inspection of surface-mounted ICs},
  author={Richard C. Blish and Susan X. Li and D. Lehtonen},
  year={2002}
}
A thin Zn filter (/spl sim/300 /spl mu/m) and relatively low X-ray tube voltage (/spl sim/45 kV) is recommended for X-ray inspection of surface-mounted device solder joints on printed wiring boards (PWBs). An optimal filter minimizes the Si dose that could result in cumulative damage to sensitive integrated circuit (IC) nodes, yet provides good contrast for metals such as Cu traces on PWBs and device solder balls. While we expect orders of magnitude Si dose reductions when effective filters are… CONTINUE READING

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