Feature extraction and damage-precursors for prognostication of lead-free electronics

@article{Lall2006FeatureEA,
  title={Feature extraction and damage-precursors for prognostication of lead-free electronics},
  author={Pradeep Lall and Madhura Hande and Chandan Bhat and Nokibul Islam and Jeffrey C. Suhling and Jay Lee},
  journal={56th Electronic Components and Technology Conference 2006},
  year={2006},
  pages={10 pp.-}
}
Damage pre-cursors based health management and prognostication methodology has been presented for electronic systems in harsh environments. The framework has been developed based on a development of correlation between damage pre-cursors and underlying degradation mechanisms in lead-free packaging architectures. The proposed methodology eliminates the need for knowledge of prior stress histories and enables interrogation of system state using the identified damage pre-cursors. Test vehicle… CONTINUE READING
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