Fault tolerance and reliability in field-programmable gate arrays

Abstract

Reduced device-level reliability and increased within-die process variability will become serious issues for future field-programmable gate arrays (FPGAs), and will result in faults developing dynamically during the lifetime of the integrated circuit. Fortunately, FPGAs have the ability to reconfigure in the field and at runtime, thus providing… (More)
DOI: 10.1049/iet-cdt.2009.0011

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