Efficient Monte Carlo-based analog parametric fault modelling
- Haralampos-G. D. Stratigopoulos, Stephen Sunter
- 2014 IEEE 32nd VLSI Test Symposium (VTS)
- 2014
1 Excerpt
Fault simulation for analog test coverage
- Published 2016 in 2016 IEEE International Test Conference (ITC)
Abstract
A practical fault simulation methodology for analog circuits in mixed-signal designs is presented. The methodology leverages the mixed-signal simulation environment of a product and performs mixed-signal fault simulation of embedded analog circuits. A set of open-circuit and short-circuit faults are extracted with guidance from layout parasitics, and… (More)